Eric Heller, Sukwon Choi, Donald Dorsey, Ramakrishna Vetury, Samuel Graham. Electrical and structural dependence of operating temperature of AlGaN/GaN HEMTs. Microelectronics Reliability, 53(6):872-877, 2013. [doi]
@article{HellerCDVG13,
title = {Electrical and structural dependence of operating temperature of AlGaN/GaN HEMTs},
author = {Eric Heller and Sukwon Choi and Donald Dorsey and Ramakrishna Vetury and Samuel Graham},
year = {2013},
doi = {10.1016/j.microrel.2013.03.004},
url = {http://dx.doi.org/10.1016/j.microrel.2013.03.004},
researchr = {https://researchr.org/publication/HellerCDVG13},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {53},
number = {6},
pages = {872-877},
}