Surface inspection using texture recognition

Lee Hepplewhite, T. John Stonham. Surface inspection using texture recognition. In 12th IAPR International Conference on Pattern Recognition, Conference A: Computer Vision & Image Processing, ICPR 1994, Jerusalem, Israel, 9-13 October, 1994, Volume 1. pages 589-591, IEEE, 1994. [doi]

Authors

Lee Hepplewhite

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T. John Stonham

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