Andreas Herkersdorf, Hananeh Aliee, Michael Engel, Michael Glaß, Christina Gimmler-Dumont, Jörg Henkel, Veit Kleeberger, Michael A. Kochte, Johannes Maximilian Kühn, Daniel Mueller-Gritschneder, Sani R. Nassif, Holm Rauchfuss, Wolfgang Rosenstiel, Ulf Schlichtmann, Muhammad Shafique, Mehdi Baradaran Tahoori, Jürgen Teich, Norbert Wehn, Christian Weis, Hans-Joachim Wunderlich. Resilience Articulation Point (RAP): Cross-layer dependability modeling for nanometer system-on-chip resilience. Microelectronics Reliability, 54(6-7):1066-1074, 2014. [doi]
@article{HerkersdorfAEGGHKKKMNRRSSTTWWW14,
title = {Resilience Articulation Point (RAP): Cross-layer dependability modeling for nanometer system-on-chip resilience},
author = {Andreas Herkersdorf and Hananeh Aliee and Michael Engel and Michael Glaß and Christina Gimmler-Dumont and Jörg Henkel and Veit Kleeberger and Michael A. Kochte and Johannes Maximilian Kühn and Daniel Mueller-Gritschneder and Sani R. Nassif and Holm Rauchfuss and Wolfgang Rosenstiel and Ulf Schlichtmann and Muhammad Shafique and Mehdi Baradaran Tahoori and Jürgen Teich and Norbert Wehn and Christian Weis and Hans-Joachim Wunderlich},
year = {2014},
doi = {10.1016/j.microrel.2013.12.012},
url = {http://dx.doi.org/10.1016/j.microrel.2013.12.012},
researchr = {https://researchr.org/publication/HerkersdorfAEGGHKKKMNRRSSTTWWW14},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {54},
number = {6-7},
pages = {1066-1074},
}