Gaussian Process Subset Scanning for Anomalous Pattern Detection in Non-iid Data

William Herlands, Edward McFowland, Andrew Gordon Wilson, Daniel B. Neill. Gaussian Process Subset Scanning for Anomalous Pattern Detection in Non-iid Data. In Amos J. Storkey, Fernando PĂ©rez-Cruz, editors, International Conference on Artificial Intelligence and Statistics, AISTATS 2018, 9-11 April 2018, Playa Blanca, Lanzarote, Canary Islands, Spain. Volume 84 of Proceedings of Machine Learning Research, pages 425-434, PMLR, 2018. [doi]

Authors

William Herlands

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Edward McFowland

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Andrew Gordon Wilson

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Daniel B. Neill

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