F. J. delaCalle Herrero, Daniel F. García, Rubén Usamentiaga. Surface Defect System for Long Product Manufacturing Using Differential Topographic Images. Sensors, 20(7):2142, 2020. [doi]
@article{HerreroGU20,
title = {Surface Defect System for Long Product Manufacturing Using Differential Topographic Images},
author = {F. J. delaCalle Herrero and Daniel F. García and Rubén Usamentiaga},
year = {2020},
doi = {10.3390/s20072142},
url = {https://doi.org/10.3390/s20072142},
researchr = {https://researchr.org/publication/HerreroGU20},
cites = {0},
citedby = {0},
journal = {Sensors},
volume = {20},
number = {7},
pages = {2142},
}