Circular BIST testing the digital logic within a high speed Serdes - researchr publication authors

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Graham Hetherington, Richard Simpson. Circular BIST testing the digital logic within a high speed Serdes. In Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte, NC, USA. pages 1221-1228, IEEE Computer Society, 2003. [doi]

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