Model-Free Testing of Analog Circuits

Mehrdad Heydarzadeh, Hao Luo, Mehrdad Nourani. Model-Free Testing of Analog Circuits. In 25th IEEE Asian Test Symposium, ATS 2016, Hiroshima, Japan, November 21-24, 2016. pages 102-106, IEEE Computer Society, 2016. [doi]

Authors

Mehrdad Heydarzadeh

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Hao Luo

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Mehrdad Nourani

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