Test sequence compaction for sequential circuits with reset states

Yoshinobu Higami, Yuzo Takamatsu, Kozo Kinoshita. Test sequence compaction for sequential circuits with reset states. In 9th Asian Test Symposium (ATS 2000), 4-6 December 2000, Taipei, Taiwan. pages 165-170, IEEE Computer Society, 2000. [doi]

Authors

Yoshinobu Higami

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Yuzo Takamatsu

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Kozo Kinoshita

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