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Takayuki Hisaka, Yasuki Aihara, Yoichi Nogami, Hajime Sasaki, Yasushi Uehara, Naohito Yoshida, Kazuo Hayashi. Degradation mechanisms of GaAs PHEMTs in high humidity conditions. Microelectronics Reliability, 45(12):1894-1900, 2005. [doi]