Eugene R. Hnatek, Billy R. Livesay. Quality Issues of High Pin Count Fine Pitch VLSI Packages. In Proceedings International Test Conference 1989, Washington, D.C., USA, August 1989. pages 397-422, IEEE Computer Society, 1989.
@inproceedings{HnatekL89,
title = {Quality Issues of High Pin Count Fine Pitch VLSI Packages},
author = {Eugene R. Hnatek and Billy R. Livesay},
year = {1989},
researchr = {https://researchr.org/publication/HnatekL89},
cites = {0},
citedby = {0},
pages = {397-422},
booktitle = {Proceedings International Test Conference 1989, Washington, D.C., USA, August 1989},
publisher = {IEEE Computer Society},
}