Using the genetic algorithm to build optimal neural networks for fault-prone module detection

Robert Hochman, Taghi M. Khoshgoftaar, Edward B. Allen, John P. Hudepohl. Using the genetic algorithm to build optimal neural networks for fault-prone module detection. In Seventh International Symposium on Software Reliability Engineering, ISSRE 1996, White Plains, NY, USA, October 30, 1996-Nov. 2, 1996. pages 152-162, IEEE Computer Society, 1996. [doi]

@inproceedings{HochmanKAH96,
  title = {Using the genetic algorithm to build optimal neural networks for fault-prone module detection},
  author = {Robert Hochman and Taghi M. Khoshgoftaar and Edward B. Allen and John P. Hudepohl},
  year = {1996},
  doi = {10.1109/ISSRE.1996.558759},
  url = {http://doi.ieeecomputersociety.org/10.1109/ISSRE.1996.558759},
  researchr = {https://researchr.org/publication/HochmanKAH96},
  cites = {0},
  citedby = {0},
  pages = {152-162},
  booktitle = {Seventh International Symposium on Software Reliability Engineering, ISSRE 1996, White Plains, NY, USA, October 30, 1996-Nov. 2, 1996},
  publisher = {IEEE Computer Society},
  isbn = {0-8186-7707-4},
}