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Focused Diagnosis for Failing Software Tests

Birgit Hofer, Seema Jehan, Ingo Pill, Franz Wotawa. Focused Diagnosis for Failing Software Tests. In Moonis Ali, Young Sig Kwon, Chang-Hwan Lee, Juntae Kim, Yongdai Kim, editors, Current Approaches in Applied Artificial Intelligence - 28th International Conference on Industrial, Engineering and Other Applications of Applied Intelligent Systems, IEA/AIE 2015, Seoul, South Korea, June 10-12, 2015, Proceedings. Volume 9101 of Lecture Notes in Computer Science, pages 712-721, Springer, 2015. [doi]

Authors

Birgit Hofer

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Seema Jehan

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Ingo Pill

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Franz Wotawa

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