Vera Hofer, Johannes Leitner, Horst Lewitschnig, Thomas Nowak. Determination of tolerance limits for the reliability of semiconductor devices using longitudinal data. Quality and Reliability Eng. Int., 33(8):2673-2683, 2017. [doi]
@article{HoferLLN17,
title = {Determination of tolerance limits for the reliability of semiconductor devices using longitudinal data},
author = {Vera Hofer and Johannes Leitner and Horst Lewitschnig and Thomas Nowak},
year = {2017},
doi = {10.1002/qre.2226},
url = {https://doi.org/10.1002/qre.2226},
researchr = {https://researchr.org/publication/HoferLLN17},
cites = {0},
citedby = {0},
journal = {Quality and Reliability Eng. Int.},
volume = {33},
number = {8},
pages = {2673-2683},
}