Mitigating the Correlation Problem in Multi-Layer Stochastic Circuits

Owen Hoffend, John P. Hayes. Mitigating the Correlation Problem in Multi-Layer Stochastic Circuits. In IEEE International Conference on Rebooting Computing, ICRC 2023, San Diego, CA, USA, December 5-6, 2023. pages 1-10, IEEE, 2023. [doi]

Authors

Owen Hoffend

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John P. Hayes

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