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Failure by Design: Influence of the RTOS Interface on Memory Fault Resilience

Martin Hoffmann, Christian Dietrich, Daniel Lohmann. Failure by Design: Influence of the RTOS Interface on Memory Fault Resilience. In Matthias Horbach, editor, Informatik 2013, 43. Jahrestagung der Gesellschaft für Informatik e.V. (GI), Informatik angepasst an Mensch, Organisation und Umwelt, 16.-20. September 2013, Koblenz. Volume 220 of LNI, pages 2562-2576, GI, 2013.

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