Dominance index for many-to-many correlation and its applicaions to semiconductor yield analysis

Amos Hong, Argon Chen. Dominance index for many-to-many correlation and its applicaions to semiconductor yield analysis. In Oliver Rose, Adelinde M. Uhrmacher, editors, Winter Simulation Conference, WSC '12, Berlin, Germany, December 9-12, 2012. pages 197, WSC, 2012. [doi]

@inproceedings{HongC12-2,
  title = {Dominance index for many-to-many correlation and its applicaions to semiconductor yield analysis},
  author = {Amos Hong and Argon Chen},
  year = {2012},
  url = {http://dl.acm.org/citation.cfm?id=2430023},
  researchr = {https://researchr.org/publication/HongC12-2},
  cites = {0},
  citedby = {0},
  pages = {197},
  booktitle = {Winter Simulation Conference, WSC '12, Berlin, Germany, December 9-12, 2012},
  editor = {Oliver Rose and Adelinde M. Uhrmacher},
  publisher = {WSC},
}