Xuenong Hong, Deruo Cheng, Yiqiong Shi, Tong Lin, Bah-Hwee Gwee. Deep Learning for Automatic IC Image Analysis. In 23rd IEEE International Conference on Digital Signal Processing, DSP 2018, Shanghai, China, November 19-21, 2018. pages 1-5, IEEE, 2018. [doi]
@inproceedings{HongCSLG18,
title = {Deep Learning for Automatic IC Image Analysis},
author = {Xuenong Hong and Deruo Cheng and Yiqiong Shi and Tong Lin and Bah-Hwee Gwee},
year = {2018},
doi = {10.1109/ICDSP.2018.8631555},
url = {https://doi.org/10.1109/ICDSP.2018.8631555},
researchr = {https://researchr.org/publication/HongCSLG18},
cites = {0},
citedby = {0},
pages = {1-5},
booktitle = {23rd IEEE International Conference on Digital Signal Processing, DSP 2018, Shanghai, China, November 19-21, 2018},
publisher = {IEEE},
isbn = {978-1-5386-6811-5},
}