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Infrared protection system for high-voltage testing of SiC and GaN FETs used in DC-DC converters

Filip Hormot, Josip Bacmaga, Adrijan Baric. Infrared protection system for high-voltage testing of SiC and GaN FETs used in DC-DC converters. In Petar Biljanovic, Zeljko Butkovic, Karolj Skala, Tihana Galinac Grbac, Marina Cicin-Sain, Vlado Sruk, Slobodan Ribaric, Stjepan Gros, Boris Vrdoljak, Mladen Mauher, Edvard Tijan, Dino Lukman, editors, 39th International Convention on Information and Communication Technology, Electronics and Microelectronics, MIPRO 2016, Opatija, Croatia, May 30 - June 3, 2016. pages 72-75, IEEE, 2016. [doi]

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Filip Hormot

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Josip Bacmaga

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Adrijan Baric

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