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Low Cost High Resolution Ampere Meter for Automated Power Tests for Constrained Devices

Mario Hoss, Florian Westmeier, Jens-Peter Akelbein. Low Cost High Resolution Ampere Meter for Automated Power Tests for Constrained Devices. In Udo Bleimann, Dirk Burkhardt, Bernhard Humm, Robert Löw, Stefanie Regier, Ingo Stengel, Paul Walsh, editors, Proceedings of the 5th Collaborative European Research Conference (CERC 2019), Darmstadt, Germany, March 29-30, 2019. Volume 2348 of CEUR Workshop Proceedings, pages 81-88, CEUR-WS.org, 2019. [doi]

Authors

Mario Hoss

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Florian Westmeier

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Jens-Peter Akelbein

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