Dennis Hou, Tuo Liu, Yen-Ting Pan, Janpu Hou. AI on edge device for laser chip defect detection. In IEEE 9th Annual Computing and Communication Workshop and Conference, CCWC 2019, Las Vegas, NV, USA, January 7-9, 2019. pages 247-251, IEEE, 2019. [doi]
@inproceedings{HouLPH19,
title = {AI on edge device for laser chip defect detection},
author = {Dennis Hou and Tuo Liu and Yen-Ting Pan and Janpu Hou},
year = {2019},
doi = {10.1109/CCWC.2019.8666503},
url = {https://doi.org/10.1109/CCWC.2019.8666503},
researchr = {https://researchr.org/publication/HouLPH19},
cites = {0},
citedby = {0},
pages = {247-251},
booktitle = {IEEE 9th Annual Computing and Communication Workshop and Conference, CCWC 2019, Las Vegas, NV, USA, January 7-9, 2019},
publisher = {IEEE},
isbn = {978-1-7281-0554-3},
}