Noises depression based on statistic analysis algorithm for Kerma area product meter design - researchr publication authors

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Chi-Wen Hsieh, Chih-Yen Chen. Noises depression based on statistic analysis algorithm for Kerma area product meter design. In IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2018, Houston, TX, USA, May 14-17, 2018. pages 1-5, IEEE, 2018. [doi]

This author has not been identified. Look up 'Chi-Wen Hsieh' in GoogleThis author has not been identified. Look up 'Chih-Yen Chen' in Google

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