Shang-Lin Hsieh, Yu-Wei Chen, Chun-Che Chen, Tsun-Wei Chang. A Geometry-Distortion Resistant Image Detection System Based on Log-Polar Transform and Scale Invariant Feature Transform. In Parimala Thulasiraman, Laurence Tianruo Yang, Qiwen Pan, Xingang Liu, Yaw-Chung Chen, Yo-Ping Huang, Lin-Huang Chang, Che-Lun Hung, Che-Rung Lee, Justin Y. Shi, Ying Zhang, editors, 13th IEEE International Conference on High Performance Computing & Communication, HPCC 2011, Banff, Alberta, Canada, September 2-4, 2011. pages 893-897, IEEE, 2011. [doi]
@inproceedings{HsiehCCC11,
title = {A Geometry-Distortion Resistant Image Detection System Based on Log-Polar Transform and Scale Invariant Feature Transform},
author = {Shang-Lin Hsieh and Yu-Wei Chen and Chun-Che Chen and Tsun-Wei Chang},
year = {2011},
doi = {10.1109/HPCC.2011.128},
url = {http://dx.doi.org/10.1109/HPCC.2011.128},
researchr = {https://researchr.org/publication/HsiehCCC11},
cites = {0},
citedby = {0},
pages = {893-897},
booktitle = {13th IEEE International Conference on High Performance Computing & Communication, HPCC 2011, Banff, Alberta, Canada, September 2-4, 2011},
editor = {Parimala Thulasiraman and Laurence Tianruo Yang and Qiwen Pan and Xingang Liu and Yaw-Chung Chen and Yo-Ping Huang and Lin-Huang Chang and Che-Lun Hung and Che-Rung Lee and Justin Y. Shi and Ying Zhang},
publisher = {IEEE},
isbn = {978-1-4577-1564-8},
}