Hsieh-Hung Hsieh, Liang-Hung Lu. Integrated CMOS Power Sensors for RF BIST Applications. In 24th IEEE VLSI Test Symposium (VTS 2006), 30 April - 4 May 2006, Berkeley, California, USA. pages 234-239, IEEE Computer Society, 2006. [doi]
@inproceedings{HsiehL06:2,
title = {Integrated CMOS Power Sensors for RF BIST Applications},
author = {Hsieh-Hung Hsieh and Liang-Hung Lu},
year = {2006},
doi = {10.1109/VTS.2006.40},
url = {http://doi.ieeecomputersociety.org/10.1109/VTS.2006.40},
researchr = {https://researchr.org/publication/HsiehL06%3A2},
cites = {0},
citedby = {0},
pages = {234-239},
booktitle = {24th IEEE VLSI Test Symposium (VTS 2006), 30 April - 4 May 2006, Berkeley, California, USA},
publisher = {IEEE Computer Society},
isbn = {0-7695-2514-8},
}