Wei-Yen Hsu, Chao-Hung Lin, Hsien-Jen Hsu, Po-Hsun Chen, I.-Ru Chen. Wavelet-based envelope features with automatic EOG artifact removal: Application to single-trial EEG data. Expert Syst. Appl., 39(3):2743-2749, 2012. [doi]
@article{HsuLHCC12,
title = {Wavelet-based envelope features with automatic EOG artifact removal: Application to single-trial EEG data},
author = {Wei-Yen Hsu and Chao-Hung Lin and Hsien-Jen Hsu and Po-Hsun Chen and I.-Ru Chen},
year = {2012},
doi = {10.1016/j.eswa.2011.08.132},
url = {http://dx.doi.org/10.1016/j.eswa.2011.08.132},
researchr = {https://researchr.org/publication/HsuLHCC12},
cites = {0},
citedby = {0},
journal = {Expert Syst. Appl.},
volume = {39},
number = {3},
pages = {2743-2749},
}