Yen-Chang Hsu, Yilin Shen, Hongxia Jin, Zsolt Kira. Generalized ODIN: Detecting Out-of-Distribution Image Without Learning From Out-of-Distribution Data. In 2020 IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR 2020, Seattle, WA, USA, June 13-19, 2020. pages 10948-10957, IEEE, 2020. [doi]
@inproceedings{HsuSJK20, title = {Generalized ODIN: Detecting Out-of-Distribution Image Without Learning From Out-of-Distribution Data}, author = {Yen-Chang Hsu and Yilin Shen and Hongxia Jin and Zsolt Kira}, year = {2020}, doi = {10.1109/CVPR42600.2020.01096}, url = {https://doi.org/10.1109/CVPR42600.2020.01096}, researchr = {https://researchr.org/publication/HsuSJK20}, cites = {0}, citedby = {0}, pages = {10948-10957}, booktitle = {2020 IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR 2020, Seattle, WA, USA, June 13-19, 2020}, publisher = {IEEE}, isbn = {978-1-7281-7168-5}, }