A Quality Verification Model for Design Pattern

Nien-Lin Hsueh, Peng-Hua Chu, Jonathan Lee, William C. Chu. A Quality Verification Model for Design Pattern. In 31st Annual International Computer Software and Applications Conference (COMPSAC 2007), 24-27 July 2007, Beijing, China. pages 531-534, IEEE Computer Society, 2007. [doi]

Authors

Nien-Lin Hsueh

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Peng-Hua Chu

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Jonathan Lee

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William C. Chu

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