Tai-Chiu Hsung, Daniel Pak-Kong Lun. Generalized cross validation for multiwavelet shrinkage. IEEE Signal Process. Lett., 11(6):549-552, 2004. [doi]
@article{HsungL04-1,
title = {Generalized cross validation for multiwavelet shrinkage},
author = {Tai-Chiu Hsung and Daniel Pak-Kong Lun},
year = {2004},
doi = {10.1109/LSP.2004.827924},
url = {http://dx.doi.org/10.1109/LSP.2004.827924},
researchr = {https://researchr.org/publication/HsungL04-1},
cites = {0},
citedby = {0},
journal = {IEEE Signal Process. Lett.},
volume = {11},
number = {6},
pages = {549-552},
}