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Machine Learning-Assisted VCD Processing for Accelerated Dynamic Voltage Drop Analysis

Jingchao Hu, Yufei Chen 0007, Songyu Sun, Jianfei Song, Li Zhang, Xunzhao Yin, Zhou Jin 0001, Cheng Zhuo. Machine Learning-Assisted VCD Processing for Accelerated Dynamic Voltage Drop Analysis. ACM Trans. Design Autom. Electr. Syst., 31(4), July 2026. [doi]

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