Deep transfer metric learning

Junlin Hu, Jiwen Lu, Yap-Peng Tan. Deep transfer metric learning. In IEEE Conference on Computer Vision and Pattern Recognition, CVPR 2015, Boston, MA, USA, June 7-12, 2015. pages 325-333, IEEE, 2015. [doi]

Authors

Junlin Hu

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Jiwen Lu

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Yap-Peng Tan

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