An Expectation-Based Scoring Approach for Explainable Software Defect Prediction

Yamin Hu, Yuhui Shi 0001, Wenjian Luo. An Expectation-Based Scoring Approach for Explainable Software Defect Prediction. IEEE Transactions on Reliability, 75:888-901, 2026. [doi]

Authors

Yamin Hu

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Yuhui Shi 0001

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Wenjian Luo

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