Jiawen Hu, Qiuzhuang Sun, Zhi Sheng Ye, Qiang Zhou 0002. Joint Modeling of Degradation and Lifetime Data for RUL Prediction of Deteriorating Products. IEEE Trans. Industrial Informatics, 17(7):4521-4531, 2021. [doi]
@article{HuSYZ21,
title = {Joint Modeling of Degradation and Lifetime Data for RUL Prediction of Deteriorating Products},
author = {Jiawen Hu and Qiuzhuang Sun and Zhi Sheng Ye and Qiang Zhou 0002},
year = {2021},
doi = {10.1109/TII.2020.3021054},
url = {https://doi.org/10.1109/TII.2020.3021054},
researchr = {https://researchr.org/publication/HuSYZ21},
cites = {0},
citedby = {0},
journal = {IEEE Trans. Industrial Informatics},
volume = {17},
number = {7},
pages = {4521-4531},
}