Bin Hu, Xinggang Wang, Wenyong Yu. Joint weakly and fully supervised learning for surface defect segmentation from images. Sig. Proc.: Image Comm., 107:116807, 2022. [doi]
@article{HuWY22-0,
title = {Joint weakly and fully supervised learning for surface defect segmentation from images},
author = {Bin Hu and Xinggang Wang and Wenyong Yu},
year = {2022},
doi = {10.1016/j.image.2022.116807},
url = {https://doi.org/10.1016/j.image.2022.116807},
researchr = {https://researchr.org/publication/HuWY22-0},
cites = {0},
citedby = {0},
journal = {Sig. Proc.: Image Comm.},
volume = {107},
pages = {116807},
}