OpenMP与环形缓冲技术在TFT-LCD缺陷检测中的应用 (Application of Open MP and Ring Buffer Technology in Defects Detection of Glass Substrate)

Haibing Hu, Ting Xu, Bo Zhang, Dongjian Xu, Shiqun Jin, Rongsheng Lu. OpenMP与环形缓冲技术在TFT-LCD缺陷检测中的应用 (Application of Open MP and Ring Buffer Technology in Defects Detection of Glass Substrate). 计算机科学, 46(11A):562-566, 2019. [doi]

@article{HuXZXJL19,
  title = {OpenMP与环形缓冲技术在TFT-LCD缺陷检测中的应用 (Application of Open MP and Ring Buffer Technology in Defects Detection of Glass Substrate)},
  author = {Haibing Hu and Ting Xu and Bo Zhang and Dongjian Xu and Shiqun Jin and Rongsheng Lu},
  year = {2019},
  url = {http://www.jsjkx.com/EN/Y2019/V46/I11A/562},
  researchr = {https://researchr.org/publication/HuXZXJL19},
  cites = {0},
  citedby = {0},
  journal = {计算机科学},
  volume = {46},
  number = {11A},
  pages = {562-566},
}