Profile directed systematic testing of concurrent programs

Yan Hu, Jun Yan, Jian Zhang, He Jiang. Profile directed systematic testing of concurrent programs. In 8th International Workshop on Automation of Software Test, AST 2013, San Francisco, CA, USA, May 18-19, 2013. pages 47-52, IEEE, 2013. [doi]

Authors

Yan Hu

This author has not been identified. Look up 'Yan Hu' in Google

Jun Yan

This author has not been identified. Look up 'Jun Yan' in Google

Jian Zhang

This author has not been identified. Look up 'Jian Zhang' in Google

He Jiang

This author has not been identified. Look up 'He Jiang' in Google