Clustered defect detection of high quality chips using self-supervised multilayer perceptron

Chenn-Jung Huang. Clustered defect detection of high quality chips using self-supervised multilayer perceptron. Expert Syst. Appl., 33(4):996-1003, 2007. [doi]

Authors

Chenn-Jung Huang

This author has not been identified. Look up 'Chenn-Jung Huang' in Google