Shi-Yu Huang. Test strategies for the clock and power distribution networks in a multi-die IC. In 2017 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2017, Hsinchu, Taiwan, April 24-27, 2017. pages 1-2, IEEE, 2017. [doi]
@inproceedings{Huang17-22,
title = {Test strategies for the clock and power distribution networks in a multi-die IC},
author = {Shi-Yu Huang},
year = {2017},
doi = {10.1109/VLSI-DAT.2017.7939646},
url = {https://doi.org/10.1109/VLSI-DAT.2017.7939646},
researchr = {https://researchr.org/publication/Huang17-22},
cites = {0},
citedby = {0},
pages = {1-2},
booktitle = {2017 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2017, Hsinchu, Taiwan, April 24-27, 2017},
publisher = {IEEE},
isbn = {978-1-5090-3969-2},
}