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A Test Cases Generation Technique Based on an Adversarial Samples Generation Algorithm for Image Classification Deep Neural Networks

Song Huang, Qiang Chen, Zhanwei Chen, Lele Chen, Jialuo Liu, Sen Yang. A Test Cases Generation Technique Based on an Adversarial Samples Generation Algorithm for Image Classification Deep Neural Networks. In 19th IEEE International Conference on Software Quality, Reliability and Security Companion, QRS Companion 2019, Sofia, Bulgaria, July 22-26, 2019. pages 520-521, IEEE, 2019. [doi]

Authors

Song Huang

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Qiang Chen

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Zhanwei Chen

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Lele Chen

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Jialuo Liu

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Sen Yang

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