Yu-Jen Huang, Ko-Wei Huang, Shih-Hsiung Lee. Defect Detection of Stainless Steel Plates Using Deep Learning Technology. In Alberto Del Bimbo, Rita Cucchiara, Stan Sclaroff, Giovanni Maria Farinella, Tao Mei 0001, Marco Bertini, Hugo Jair Escalante, Roberto Vezzani, editors, Pattern Recognition. ICPR International Workshops and Challenges - Virtual Event, January 10-15, 2021, Proceedings, Part IV. Volume 12664 of Lecture Notes in Computer Science, pages 289-301, Springer, 2020. [doi]
@inproceedings{HuangHL20-7,
title = {Defect Detection of Stainless Steel Plates Using Deep Learning Technology},
author = {Yu-Jen Huang and Ko-Wei Huang and Shih-Hsiung Lee},
year = {2020},
doi = {10.1007/978-3-030-68799-1_20},
url = {https://doi.org/10.1007/978-3-030-68799-1_20},
researchr = {https://researchr.org/publication/HuangHL20-7},
cites = {0},
citedby = {0},
pages = {289-301},
booktitle = {Pattern Recognition. ICPR International Workshops and Challenges - Virtual Event, January 10-15, 2021, Proceedings, Part IV},
editor = {Alberto Del Bimbo and Rita Cucchiara and Stan Sclaroff and Giovanni Maria Farinella and Tao Mei 0001 and Marco Bertini and Hugo Jair Escalante and Roberto Vezzani},
volume = {12664},
series = {Lecture Notes in Computer Science},
publisher = {Springer},
isbn = {978-3-030-68799-1},
}