Ke Huang, Nathan Kupp, John M. Carulli Jr., Yiorgos Makris. On combining alternate test with spatial correlation modeling in analog/RF ICs. In 18th IEEE European Test Symposium, ETS 2013, Avignon, France, May 27-30, 2013. pages 1-6, IEEE Computer Society, 2013. [doi]
No references recorded for this publication.
No citations of this publication recorded.