Yu-Jen Huang, Jin-Fu Li. Testing ternary content addressable memories with active neighbourhood pattern-sensitive faults. IET Computers & Digital Techniques, 1(3):246-255, 2007. [doi]
@article{HuangL07-1,
title = {Testing ternary content addressable memories with active neighbourhood pattern-sensitive faults},
author = {Yu-Jen Huang and Jin-Fu Li},
year = {2007},
url = {http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=4205041},
tags = {testing},
researchr = {https://researchr.org/publication/HuangL07-1},
cites = {0},
citedby = {0},
journal = {IET Computers & Digital Techniques},
volume = {1},
number = {3},
pages = {246-255},
}