Zeqi Huang, Fei Lu, Yafang Tong, Tianru Shi. Technology for the Detection of Ablation Defects in Buffer Layers of High-Voltage Cables. IEEE Access, 10:92843-92853, 2022. [doi]
@article{HuangLTS22,
title = {Technology for the Detection of Ablation Defects in Buffer Layers of High-Voltage Cables},
author = {Zeqi Huang and Fei Lu and Yafang Tong and Tianru Shi},
year = {2022},
doi = {10.1109/ACCESS.2022.3203054},
url = {https://doi.org/10.1109/ACCESS.2022.3203054},
researchr = {https://researchr.org/publication/HuangLTS22},
cites = {0},
citedby = {0},
journal = {IEEE Access},
volume = {10},
pages = {92843-92853},
}