Songling Huang, Yue Long, Shen Wang, Wei Zhao. A Method for Identifying Inclined Defects by Using Magnetic Flux Leakage Spectral Envelope Detection. In IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2019, Auckland, New Zealand, May 20-23, 2019. pages 1-5, IEEE, 2019. [doi]
@inproceedings{HuangLWZ19-1,
title = {A Method for Identifying Inclined Defects by Using Magnetic Flux Leakage Spectral Envelope Detection},
author = {Songling Huang and Yue Long and Shen Wang and Wei Zhao},
year = {2019},
doi = {10.1109/I2MTC.2019.8826821},
url = {https://doi.org/10.1109/I2MTC.2019.8826821},
researchr = {https://researchr.org/publication/HuangLWZ19-1},
cites = {0},
citedby = {0},
pages = {1-5},
booktitle = {IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2019, Auckland, New Zealand, May 20-23, 2019},
publisher = {IEEE},
isbn = {978-1-5386-3460-8},
}