Szu-Hao Huang, Ying-Cheng Pan. Automated visual inspection in the semiconductor industry: A survey. Computers in Industry, 66:1-10, 2015. [doi]
@article{HuangP15,
title = {Automated visual inspection in the semiconductor industry: A survey},
author = {Szu-Hao Huang and Ying-Cheng Pan},
year = {2015},
doi = {10.1016/j.compind.2014.10.006},
url = {http://dx.doi.org/10.1016/j.compind.2014.10.006},
researchr = {https://researchr.org/publication/HuangP15},
cites = {0},
citedby = {0},
journal = {Computers in Industry},
volume = {66},
pages = {1-10},
}