Gan Huang, Zhiguo Zhang. Improving sensitivity of cluster-based permutation test for EEG/MEG data. In 8th International IEEE/EMBS Conference on Neural Engineering, NER 2017, Shanghai, China, May 25-28, 2017. pages 9-12, IEEE, 2017. [doi]
@inproceedings{HuangZ17-23,
title = {Improving sensitivity of cluster-based permutation test for EEG/MEG data},
author = {Gan Huang and Zhiguo Zhang},
year = {2017},
doi = {10.1109/NER.2017.8008279},
url = {https://doi.org/10.1109/NER.2017.8008279},
researchr = {https://researchr.org/publication/HuangZ17-23},
cites = {0},
citedby = {0},
pages = {9-12},
booktitle = {8th International IEEE/EMBS Conference on Neural Engineering, NER 2017, Shanghai, China, May 25-28, 2017},
publisher = {IEEE},
isbn = {978-1-5090-4603-4},
}