A novel multiple-stress-based predictive model of LEDs for rapid lifetime estimation

Su-Dan Huang, Lin Zhou, Guang-zhong Cao, Huai-Yuan Liu, Yi-Min Hu, Gang Jing, Ming-Gao Cao, Wen-Peng Xiao, Yan Liu. A novel multiple-stress-based predictive model of LEDs for rapid lifetime estimation. Microelectronics Reliability, 78:46-52, 2017. [doi]

@article{HuangZCLHJCXL17,
  title = {A novel multiple-stress-based predictive model of LEDs for rapid lifetime estimation},
  author = {Su-Dan Huang and Lin Zhou and Guang-zhong Cao and Huai-Yuan Liu and Yi-Min Hu and Gang Jing and Ming-Gao Cao and Wen-Peng Xiao and Yan Liu},
  year = {2017},
  doi = {10.1016/j.microrel.2017.07.094},
  url = {https://doi.org/10.1016/j.microrel.2017.07.094},
  researchr = {https://researchr.org/publication/HuangZCLHJCXL17},
  cites = {0},
  citedby = {0},
  journal = {Microelectronics Reliability},
  volume = {78},
  pages = {46-52},
}