A Lightweight Fine-Grained Perception Defect Inspection Network Under Multitask Learning on Highly Reflective Surface

Tao Huang, Liming Zhao, Yabo Zhang, Jican Tian, Wenlong Zhou. A Lightweight Fine-Grained Perception Defect Inspection Network Under Multitask Learning on Highly Reflective Surface. IEEE T. Instrumentation and Measurement, 73:1-10, 2024. [doi]

@article{HuangZZTZ24,
  title = {A Lightweight Fine-Grained Perception Defect Inspection Network Under Multitask Learning on Highly Reflective Surface},
  author = {Tao Huang and Liming Zhao and Yabo Zhang and Jican Tian and Wenlong Zhou},
  year = {2024},
  doi = {10.1109/TIM.2024.3353264},
  url = {https://doi.org/10.1109/TIM.2024.3353264},
  researchr = {https://researchr.org/publication/HuangZZTZ24},
  cites = {0},
  citedby = {0},
  journal = {IEEE T. Instrumentation and Measurement},
  volume = {73},
  pages = {1-10},
}