Zhang Hui. Fault Localization Method Generated by Regression Test Cases on the Basis of Genetic Immune Algorithm. In 40th IEEE Annual Computer Software and Applications Conference, COMPSAC Workshops 2016, Atlanta, GA, USA, June 10-14, 2016. pages 46-51, IEEE, 2016. [doi]
@inproceedings{Hui16-1,
title = {Fault Localization Method Generated by Regression Test Cases on the Basis of Genetic Immune Algorithm},
author = {Zhang Hui},
year = {2016},
doi = {10.1109/COMPSAC.2016.115},
url = {http://doi.ieeecomputersociety.org/10.1109/COMPSAC.2016.115},
researchr = {https://researchr.org/publication/Hui16-1},
cites = {0},
citedby = {0},
pages = {46-51},
booktitle = {40th IEEE Annual Computer Software and Applications Conference, COMPSAC Workshops 2016, Atlanta, GA, USA, June 10-14, 2016},
publisher = {IEEE},
isbn = {978-1-4673-8845-0},
}