A Leakage-Compensated PLL in 65-nm CMOS Technology

Chao-Ching Hung, Shen-Iuan Liu. A Leakage-Compensated PLL in 65-nm CMOS Technology. IEEE Trans. on Circuits and Systems, 56-II(7):525-529, 2009. [doi]

Authors

Chao-Ching Hung

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Shen-Iuan Liu

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