Tauqeer Hussain, Shafay Shamail, Mian M. Awais. Improving quality in conceptual modeling. In John M. Vlissides, Douglas C. Schmidt, editors, Companion to the 19th Annual ACM SIGPLAN Conference on Object-Oriented Programming, Systems, Languages, and Applications, OOPSLA 2004, October 24-28, 2004, Vancouver, BC, Canada. pages 170-171, ACM, 2004. [doi]
@inproceedings{HussainSA04,
title = {Improving quality in conceptual modeling},
author = {Tauqeer Hussain and Shafay Shamail and Mian M. Awais},
year = {2004},
doi = {10.1145/1028664.1028734},
url = {http://doi.acm.org/10.1145/1028664.1028734},
tags = {meta-model, modeling, Meta-Environment},
researchr = {https://researchr.org/publication/HussainSA04},
cites = {0},
citedby = {0},
pages = {170-171},
booktitle = {Companion to the 19th Annual ACM SIGPLAN Conference on Object-Oriented Programming, Systems, Languages, and Applications, OOPSLA 2004, October 24-28, 2004, Vancouver, BC, Canada},
editor = {John M. Vlissides and Douglas C. Schmidt},
publisher = {ACM},
isbn = {1-58113-833-4},
}