Sun-Myung Hwang. Quality Metrics for Software Process Certification Based on K-model. In 24th IEEE International Conference on Advanced Information Networking and Applications Workshops, WAINA 2010, Perth, Australia, 20-13 April 2010. pages 827-830, IEEE Computer Society, 2010. [doi]
@inproceedings{Hwang10,
title = {Quality Metrics for Software Process Certification Based on K-model},
author = {Sun-Myung Hwang},
year = {2010},
doi = {10.1109/WAINA.2010.184},
url = {http://doi.ieeecomputersociety.org/10.1109/WAINA.2010.184},
tags = {rule-based, certification, process modeling},
researchr = {https://researchr.org/publication/Hwang10},
cites = {0},
citedby = {0},
pages = {827-830},
booktitle = {24th IEEE International Conference on Advanced Information Networking and Applications Workshops, WAINA 2010, Perth, Australia, 20-13 April 2010},
publisher = {IEEE Computer Society},
isbn = {978-0-7695-4019-1},
}